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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - An Efficient Algorithm for Finding a Universal Set of Testable Long Paths

✍ Scribed by He, Zijian; Lv, Tao; Li, Huawei; Li, Xiaowei

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