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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level

✍ Scribed by Kochte, Michael A.; Zoellin, Christian G.; Baranowski, Rafal; Imhof, Michael E.; Wunderlich, Hans-Joachim; Hatami, Nadereh; Carlo, Stefano Di; Prinetto, Paolo

Book ID: 118039026
Publisher: IEEE
Year: 2010
Weight: 307 KB
Volume: 0
Category: Article
ISBN: 1424488419
DOI: 10.1109/ats.2010.10

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