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[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Design for Low Power Testing of Computation Modules with Contiguous Subspace in VLSI

✍ Scribed by Xiao, Ji-Xue; Xie, Yong-Le; Chen, Guang-Ju

Book ID: 121796433
Publisher: IEEE
Year: 2009
Weight: 250 KB
Category: Article
ISBN: 1424425875
DOI: 10.1109/CAS-ICTD.2009.4960801

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