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[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - An All CMOS Temperature Sensor for Thermal Monitoring of VLSI Circuits

✍ Scribed by Ren, Yi; Wang, Chenxu; Hong, Hong

Book ID: 115485643
Publisher: IEEE
Year: 2009
Weight: 276 KB
Volume: 0
Category: Article
ISBN: 1424425875
DOI: 10.1109/cas-ictd.2009.4960775

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