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[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Analysis of Combined Channel Mismatch Effects in Time-Interleaved ADC Systems

✍ Scribed by Zhang, Hao; Shi, Yibing; Wang, Zhigang

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