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[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Analysis and Simulation of Balanced Low Noise Amplifier

✍ Scribed by Sun, Guoying; Bao, Jingfu

Book ID: 120577927
Publisher: IEEE
Year: 2009
Weight: 239 KB
Category: Article
ISBN: 1424425875
DOI: 10.1109/CAS-ICTD.2009.4960781

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