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[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - A Loss of Reference Clock Detect Circuit

✍ Scribed by Lv, Jian; Jiang, Yadong; Zhang, Donglu; Liu, Jason

Book ID: 121840266
Publisher: IEEE
Year: 2009
Weight: 311 KB
Category: Article
ISBN: 1424425875
DOI: 10.1109/CAS-ICTD.2009.4960749

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