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[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - A Non-Intrusive and Accurate Inspection Method for Segment Delay Variabilities

✍ Scribed by Chen, Ying-Yen; Liou, Jing-Jia

No coin nor oath required. For personal study only.

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