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[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - An Adaptive Test for Parametric Faults Based on Statistical Timing Information

✍ Scribed by Shintani, Michihiro; Uezono, Takumi; Takahashi, Tomoyuki; Ueyama, Hiroyuki; Sato, Takashi; Hatayama, Kazumi; Aikyo, Takashi; Masu, Kazuya

Book ID: 121088937
Publisher: IEEE
Year: 2009
Weight: 464 KB
Category: Article
ISBN: 0769538649
DOI: 10.1109/ATS.2009.90

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