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[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - Transaction Level Modeling and Design Space Exploration for SOC Test Architectures

โœ Scribed by Chang, Chin-Yao; Hsiao, Chih-Yuan; Lee, Kuen-Jong; Su, Alan P.


Book ID
118255314
Publisher
IEEE
Year
2009
Weight
454 KB
Volume
0
Category
Article
ISBN
0769538649

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