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[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - A Partially-Exhaustive Gate Transition Fault Model

✍ Scribed by Keller, Brion; Meehl, Dale; Uzzaman, Anis; Billings, Richard

No coin nor oath required. For personal study only.

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