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[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing

✍ Scribed by Lee, Lung-Jen; Tseng, Wang-Dauh; Lin, Rung-Bin; Yu, Chi-Wei

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