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[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - Kiss the Scan Goodbye: A Non-scan Architecture for High Coverage, Low Test Data Volume and Low Test Application Time

โœ Scribed by Hsiao, Michael S.; Banga, Mainak


Book ID
120187933
Publisher
IEEE
Year
2009
Weight
437 KB
Category
Article
ISBN
0769538649

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