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[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - An Adaptive-Rate Error Correction Scheme for NAND Flash Memory

✍ Scribed by Chen, Te-Hsuan; Hsiao, Yu-Ying; Hsing, Yu-Tsao; Wu, Cheng-Wen

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