𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - A low-cost fault-tolerant technique for Carry Look-Ahead adder

✍ Scribed by Namazi, Alireza; Sedaghat, Yasser; Miremadi, Seyed Ghassem; Ejlali, Alireza

Book ID: 120271046
Publisher: IEEE
Year: 2009
Weight: 235 KB
Category: Article
ISBN: 1424445965
DOI: 10.1109/IOLTS.2009.5196019

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2009 15th IEEE International On-Li

[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - DFx for massively multiprocessors

✍ Vera, Xavier 📂 Article 📅 2009 🏛 IEEE ⚖ 42 KB

[IEEE 2009 15th IEEE International On-Li

[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - A fast error correction technique for matrix multiplication algorithms

✍ Argyrides, C.; Lisboa, C. A. L.; Pradhan, D. K.; Carro, L. 📂 Article 📅 2009 🏛 IEEE ⚖ 199 KB

[IEEE 2009 15th IEEE International On-Li

[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - Fault injection-based evaluation of a synchronous NoC router

✍ Eghbal, Ashkan; Yaghini, Pooria M.; Pedram, Hossein; Zarandi, Hamid R. 📂 Article 📅 2009 🏛 IEEE ⚖ 276 KB

[IEEE 2009 15th IEEE International On-Li

[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies

✍ Semiao, J.; Freijedo, J.; Rodriguez-Andina, J.; Vargas, F.; Santos, M.; Teixeira 📂 Article 📅 2009 🏛 IEEE ⚖ 184 KB

[IEEE 2009 15th IEEE International On-Li

[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - SRAM cell design using tri-state devices for SEU protection

✍ Shiyanovskii, Yuriy; Wolff, Frank; Papachristou, Chris 📂 Article 📅 2009 🏛 IEEE ⚖ 232 KB

[IEEE 2009 15th IEEE International On-Li

[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - Evaluating large grain TMR and selective partial reconfiguration for soft error mitigation in SRAM-based FPGAs

✍ Azambuja, Jose Rodrigo; Sousa, Fernando; Rosa, Lucas; Kastensmidt, Fernanda Lima 📂 Article 📅 2009 🏛 IEEE ⚖ 649 KB