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[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - SRAM cell design using tri-state devices for SEU protection

✍ Scribed by Shiyanovskii, Yuriy; Wolff, Frank; Papachristou, Chris

Book ID: 118058974
Publisher: IEEE
Year: 2009
Weight: 232 KB
Volume: 0
Category: Article
ISBN: 1424445965
DOI: 10.1109/iolts.2009.5195992

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