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[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - A methodology for measuring transistor ageing effects towards accurate reliability simulation

✍ Scribed by Maricau, Elie; Gielen, Georges

Book ID: 126714604
Publisher: IEEE
Year: 2009
Weight: 267 KB
Category: Article
ISBN: 1424445965
DOI: 10.1109/IOLTS.2009.5195978

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