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[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies

✍ Scribed by Semiao, J.; Freijedo, J.; Rodriguez-Andina, J.; Vargas, F.; Santos, M.; Teixeira, I.; Teixeira, P.

Book ID: 120200927
Publisher: IEEE
Year: 2009
Weight: 184 KB
Category: Article
ISBN: 1424445965
DOI: 10.1109/IOLTS.2009.5196020

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