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[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - Evaluating large grain TMR and selective partial reconfiguration for soft error mitigation in SRAM-based FPGAs

✍ Scribed by Azambuja, Jose Rodrigo; Sousa, Fernando; Rosa, Lucas; Kastensmidt, Fernanda Lima

Book ID: 120223526
Publisher: IEEE
Year: 2009
Weight: 649 KB
Category: Article
ISBN: 1424445965
DOI: 10.1109/IOLTS.2009.5195990

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