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[IEEE 2009 10th Latin American Test Workshop - Rio de Janeiro, Brazil (2009.03.2-2009.03.5)] 2009 10th Latin American Test Workshop - Study of radiation effects on PIN photodiodes with deep-trap levels using computer modeling

✍ Scribed by Cappelletti, M.A.; Cedola, A.P.; Baron, S.; Casas, G.; Peltzer y Blanca, E.L.

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