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[IEEE 2009 10th Latin American Test Workshop - Rio de Janeiro, Brazil (2009.03.2-2009.03.5)] 2009 10th Latin American Test Workshop - Turning JTAG inside out for fast extended test access

✍ Scribed by Devadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund

No coin nor oath required. For personal study only.

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