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[IEEE 2009 10th Latin American Test Workshop - Rio de Janeiro, Brazil (2009.03.2-2009.03.5)] 2009 10th Latin American Test Workshop - NoC interconnection functional testing: Using boundary-scan to reduce the overall testing time

✍ Scribed by Herve, Marcos B.; Cota, Erika; Kastensmidt, Fernanda L.; Lubaszewski, Marcelo

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