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[IEEE 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2008.04.23-2008.04.25)] 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Exploiting capacitance in high-performance computer systems

โœ Scribed by Chow, Alex; Hopkins, David; Drost, Robert; Ho, Ron


Book ID
126663087
Publisher
IEEE
Year
2008
Weight
244 KB
Category
Article
ISBN
1424416167

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