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[IEEE 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2008.04.23-2008.04.25)] 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - New transient detection circuit for system-level ESD protection

✍ Scribed by Yen, Cheng-Cheng; Liao, Chi-Sheng; Ker, Ming-Dou

Book ID: 121676496
Publisher: IEEE
Year: 2008
Weight: 771 KB
Category: Article
ISBN: 1424416167
DOI: 10.1109/VDAT.2008.4542442

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