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[IEEE 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2008.04.23-2008.04.25)] 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Obstacle-Avoiding Rectilinear Steiner Minimal Tree construction

✍ Scribed by Yung-Tai Chang, ; Ya-Wen Tsai, ; Jun-Cheng Chi, ; Mely Chen Chi,

Book ID: 126634783
Publisher: IEEE
Year: 2008
Weight: 791 KB
Category: Article
ISBN: 1424416167
DOI: 10.1109/VDAT.2008.4542406

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