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[IEEE 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2008.04.23-2008.04.25)] 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - A feasibility study of on-wafer wireless testing

โœ Scribed by Park, Piljae; Yue, C. Patrick


Book ID
121216856
Publisher
IEEE
Year
2008
Weight
284 KB
Category
Article
ISBN
1424416167

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