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[IEEE 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2008.04.23-2008.04.25)] 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - A feasibility study of on-wafer wireless testing

✍ Scribed by Park, Piljae; Yue, C. Patrick

Book ID: 121216856
Publisher: IEEE
Year: 2008
Weight: 284 KB
Category: Article
ISBN: 1424416167
DOI: 10.1109/VDAT.2008.4542472

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