𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Copper line topology impact of SiOCH low-k dielectric reliability in advanced 45nm technology node and beyond

✍ Scribed by Vilmay, M.; Roy, D.; Monget, C.; Volpi, F.; Chaix, J-M.

Book ID: 126761628
Publisher: IEEE
Year: 2008
Weight: 629 KB
Category: Article
ISBN: 1424421942
DOI: 10.1109/IRWS.2008.4796123

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2008 IEEE International Integrated

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - JEDEC Overview

✍ Strong, Alvin 📂 Article 📅 2008 🏛 IEEE ⚖ 736 KB

[IEEE 2008 IEEE International Integrated

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - eFuse Design and Reliability

✍ Tonti, William 📂 Article 📅 2008 🏛 IEEE ⚖ 736 KB

[IEEE 2008 IEEE International Integrated

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Positive Bias Temperature Instability Effects in advanced High-k / Metal Gate NMOSFETs

✍ Ioannou, D.P.; Mittl, S.; LaRosa, G. 📂 Article 📅 2008 🏛 IEEE ⚖ 926 KB

[IEEE 2008 IEEE International Integrated

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Reliability Guard Band Reduction by Differential Targeting of pMOS Gate Oxide Thickness

✍ Geilenkeuser, R.; Wieczorek, K.; Trentzsch, M.; Graetsch, F.; Bayha, B.; Samohva 📂 Article 📅 2008 🏛 IEEE ⚖ 987 KB

[IEEE 2008 IEEE International Integrated

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Investigation of GIDL current Injection Disturb Mechanism in two-transistor-eNVM memory devices

✍ Kim, S.R.; Han, K. J.; Lee, Junmin; Zhou, Tony; Lee, K.S.; Liu, Patty; Lee, P.Y. 📂 Article 📅 2008 🏛 IEEE ⚖ 879 KB

[IEEE 2008 IEEE International Integrated

[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Advanced On-The-Fly Method with Correction of Initial Values to Characterize Negative Bias Temperature Instability Reliability (NBTI)

✍ Benard, Christelle; Ogier, Jean-Luc; Goguenheim, Didier 📂 Article 📅 2008 🏛 IEEE ⚖ 255 KB