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[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Advanced On-The-Fly Method with Correction of Initial Values to Characterize Negative Bias Temperature Instability Reliability (NBTI)

✍ Scribed by Benard, Christelle; Ogier, Jean-Luc; Goguenheim, Didier

Book ID: 126721649
Publisher: IEEE
Year: 2008
Weight: 255 KB
Category: Article
ISBN: 1424421942
DOI: 10.1109/IRWS.2008.4796122

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