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[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - A novel pseudo tri-gate vertical MOSFET with source/drain tie

✍ Scribed by Jyi-Tsong Lin, ; Ying-Chieh Tsai, ; Yi-Chuen Eng, ; Shiang-Shi Kang, ; Yi-Ming Tseng, ; Hung-Jen Tseng, ; Po-Hsieh Lin,

Book ID: 120838251
Publisher: IEEE
Year: 2008
Weight: 1015 KB
Category: Article
ISBN: 1424420393
DOI: 10.1109/IPFA.2008.4588183

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