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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection

✍ Scribed by Pouget, V.; Douin, A.; Foucard, G.; Peronnard, P.; Lewis, D.; Fouillat, P.; Velazco, R.

No coin nor oath required. For personal study only.

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