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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - A New Approach for Transient Fault Injection Using Symbolic Simulation

✍ Scribed by Darbari, Ashish; Hashimi, Bashir Al; Harrod, Peter; Bradley, Daryl

No coin nor oath required. For personal study only.

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