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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - On-chip timing uncertainty measurements on IBM microprocessors

✍ Scribed by Franch, R.; Restle, P.; James, N.; Huott, W.; Friedrich, J.; Dixon, R.; Weitzel, S.; Van Goor, K.; Salem, G.

No coin nor oath required. For personal study only.

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