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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Programmable deterministic Built-In Self-Test

✍ Scribed by Hakmi, Abdul-Wahid; Wunderlich, Hans-Joachim; Zoellin, Christian G.; Glowatz, Andreas; Hapke, Friedrich

No coin nor oath required. For personal study only.

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