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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Testing for systematic defects based on DFM guidelines

✍ Scribed by Dongok Kim, ; Amyeen, M. Enamul; Srikanth Venkataraman, ; Pomeranz, Irith; Swagato Basumallick, ; Landau, Berni

Book ID: 126634772
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 197 KB
Category: Article
ISBN: 1424411270
DOI: 10.1109/TEST.2007.4437603

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