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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Redefining and testing interconnect faults in Mesh NoCs

✍ Scribed by Cota, Erika; Kastensmidt, Fernanda Lima; Amory, Alexandre; Cassel, Maico; Lubasweski, Marcelo; Meirelles, Paulo

Book ID: 126624199
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 356 KB
Category: Article
ISBN: 1424411270
DOI: 10.1109/TEST.2007.4437574

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