[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - A Study of the As-Processed and Generated Leakage Paths in Al2O3-Based Dielectric Stacks for Nonvolatile Memory Applications

[IEEE 2006 European Solid-State Device R

✍ Sauerbrey, Jens; Holzapfl, Birgit; Unertl, Marcus; Haywood, Theo; Wohlrab, Erdmu 📂 Article 📅 2006 🏛 IEEE ⚖ 484 KB

[IEEE 2006 European Solid-State Device R

✍ Rudenko, Tamara; Nazarov, Alexey; Kilchytska, Valeria; Flandre, Denis; Collaert, 📂 Article 📅 2006 🏛 IEEE ⚖ 465 KB

[IEEE 2006 European Solid-State Device R

✍ Furnemont, A.; Rosmeulen, M.; Houdt, J.; Meyer, K.; Maes, H. 📂 Article 📅 2006 🏛 IEEE ⚖ 139 KB

[IEEE 2006 European Solid-State Device R

✍ Leman, O.; Chaehoi, A.; Mailly, F.; Latorre, L.; Nouet, P. 📂 Article 📅 2006 🏛 IEEE ⚖ 512 KB

[IEEE 2006 European Solid-State Device R

✍ Gnani, E.; Reggiani, S.; Rudan, M.; Baccarani, G. 📂 Article 📅 2006 🏛 IEEE ⚖ 240 KB

[IEEE 2006 European Solid-State Device R

✍ Weber, W.; Graham, A.; Duesberg, G.; Liebau, M.; Cheze, C.; Geelhaar, L.; Unger, 📂 Article 📅 2006 🏛 IEEE ⚖ 684 KB