✦ LIBER ✦

[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - Experimental Evidence for Reduction of Gate Tunneling Current in FinFET Structures and Its Dependence on the Fin Width

✍ Scribed by Rudenko, Tamara; Nazarov, Alexey; Kilchytska, Valeria; Flandre, Denis; Collaert, Nadine; Jurczak, Malgorzata

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2006 European Solid-State Device R

✍ Roy, A.; Chauhan, Y.; Sallese, J.-m.; Enz, C.; Ionescu, A.; Declercq, M. 📂 Article 📅 2006 🏛 IEEE ⚖ 533 KB

[IEEE 2006 European Solid-State Device R

✍ Weber, W.; Graham, A.; Duesberg, G.; Liebau, M.; Cheze, C.; Geelhaar, L.; Unger, 📂 Article 📅 2006 🏛 IEEE ⚖ 684 KB

[IEEE 2006 European Solid-State Device R

✍ Bethoux, J.-m.; Happy, H.; Dambrine, G.; Borghetti, J.; Derycke, V.; Goffman, M. 📂 Article 📅 2006 🏛 IEEE ⚖ 777 KB

[IEEE 2006 European Solid-State Device R

✍ Boucart, Kathy; Ionescu, Adrian 📂 Article 📅 2006 🏛 IEEE ⚖ 499 KB

[IEEE 2006 European Solid-State Device R

✍ Gnani, E.; Reggiani, S.; Rudan, M.; Baccarani, G. 📂 Article 📅 2006 🏛 IEEE ⚖ 240 KB

[IEEE 2006 European Solid-State Device R

✍ Gnani, E.; Reggiani, S.; Rudan, M.; Baccarani, G. 📂 Article 📅 2006 🏛 IEEE ⚖ 265 KB