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[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - Fast Kerf- and Tester-Compatible Method for RC Characterization of DRAM Memory Cells

✍ Scribed by Sauerbrey, Jens; Holzapfl, Birgit; Unertl, Marcus; Haywood, Theo; Wohlrab, Erdmute; Frey, Alexander; Thewes, Roland

Book ID: 126642914
Publisher: IEEE
Year: 2006
Weight: 484 KB
Category: Article
ISBN-13: 9781424403011
DOI: 10.1109/ESSDER.2006.307727

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