[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - Quantifying Self-Heating Effects in Strained Si MOSFETs with Scaling

[IEEE 2006 European Solid-State Device R

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[IEEE 2006 European Solid-State Device R

✍ Furnemont, A.; Rosmeulen, M.; Houdt, J.; Meyer, K.; Maes, H. 📂 Article 📅 2006 🏛 IEEE ⚖ 139 KB

[IEEE 2006 European Solid-State Device R

✍ Bethoux, J.-m.; Happy, H.; Dambrine, G.; Borghetti, J.; Derycke, V.; Goffman, M. 📂 Article 📅 2006 🏛 IEEE ⚖ 777 KB

[IEEE 2006 European Solid-State Device R

✍ Rochette, F.; Casse, M.; Mouis, M.; Blachier, D.; Leroux, C.; Guillaumot, B.; Re 📂 Article 📅 2006 🏛 IEEE ⚖ 971 KB

[IEEE 2006 European Solid-State Device R

✍ Defay, Emmanuel; Wolozan, David; Garrec, Pierre; Andre, Bernard; Ulmer, Laurent; 📂 Article 📅 2006 🏛 IEEE ⚖ 665 KB

[IEEE 2006 European Solid-State Device R

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