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[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - Electron mobility enhancement in uniaxially strained MOSFETs: Extraction of the effective mass variation

โœ Scribed by Rochette, F.; Casse, M.; Mouis, M.; Blachier, D.; Leroux, C.; Guillaumot, B.; Reimbold, G.; Boulanger, F.


Book ID
126683307
Publisher
IEEE
Year
2006
Weight
971 KB
Category
Article
ISBN-13
9781424403011

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