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[IEEE 2005 International Semiconductor Device Research Symposium - Bethesda, Maryland, USA (Dec. 7-9, 2005)] 2005 International Semiconductor Device Research Symposium - Parameter Extraction and SPICE Model Development for 4H-Silicon Carbide (SiC) Power MOSFET

โœ Scribed by Hasanuzzaman, M.; Islam, S.K.; Alam, M.T.


Book ID
121359159
Publisher
IEEE
Year
2005
Tongue
English
Weight
239 KB
Category
Article
ISBN-13
9781424400836

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