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[IEEE 2005 International Semiconductor Device Research Symposium - Bethesda, Maryland, USA (Dec. 7-9, 2005)] 2005 International Semiconductor Device Research Symposium - An experimental 4RTD logic gate

✍ Scribed by Yamada, A.; Yamada, H.; Waho, T.; Khorenko, V.; Do, T.; Prost, W.

Book ID: 111922751
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 105 KB
Volume: 0
Category: Article
ISBN-13: 9781424400836
DOI: 10.1109/isdrs.2005.1595955

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