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[IEEE 2005 International Semiconductor Device Research Symposium - Bethesda, Maryland, USA (Dec. 7-9, 2005)] 2005 International Semiconductor Device Research Symposium - Scaling Rules for Tunnel Field-Effect Transistors

โœ Scribed by Bhuwalka, K.K.; Born, M.; Schindler, M.; Eisele, I.


Book ID
126649457
Publisher
IEEE
Year
2005
Tongue
English
Weight
148 KB
Category
Article
ISBN-13
9781424400836

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