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[IEEE 2005 International Semiconductor Device Research Symposium - Bethesda, Maryland, USA (Dec. 7-9, 2005)] 2005 International Semiconductor Device Research Symposium - Full 3D Process and Device Simulation for FinFET optimization

โœ Scribed by Nawaz, M.; Haibach, P.; Landgraf, E.; Rosner, W.; Stadele, M.; Luyken, R.J.; Gencer, A.


Book ID
126765400
Publisher
IEEE
Year
2005
Tongue
English
Weight
466 KB
Category
Article
ISBN-13
9781424400836

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