✦ LIBER ✦

[IEEE 2005 International Semiconductor Device Research Symposium - Bethesda, Maryland, USA (Dec. 7-9, 2005)] 2005 International Semiconductor Device Research Symposium - I-V Characteristics Modeling and Parameter Extraction for CNT-FETs

✍ Scribed by Marulanda, J.M.; Srivastava, A.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2005 International Semiconductor D

✍ Yamada, A.; Yamada, H.; Waho, T.; Khorenko, V.; Do, T.; Prost, W. 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 105 KB

[IEEE 2005 International Semiconductor D

✍ Anantram, M.P.; Svizhenko, A.; Mehrez, H. 📂 Article 📅 2005 🏛 IEEE ⚖ 384 KB

[IEEE 2005 International Semiconductor D

✍ Bhuwalka, K.K.; Born, M.; Schindler, M.; Eisele, I. 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 148 KB

[IEEE 2005 International Semiconductor D

✍ Bergman, L.; Morrison, J.L.; Xiang-Bai Chen, ; Huso, J.; Hoeck, H.; Zheleva, T. 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 389 KB

[IEEE 2005 International Semiconductor D

✍ Imre, A.; Lili Ji, ; Csaba, G.; Orlov, A.; Bernstein, G.H.; Porod, W. 📂 Article 📅 2005 🏛 IEEE ⚖ 183 KB

[IEEE 2005 International Semiconductor D

✍ Nawaz, M.; Haibach, P.; Landgraf, E.; Rosner, W.; Stadele, M.; Luyken, R.J.; Gen 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 466 KB