𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Stability of PEEC models with respect to partial element accuracy

✍ Scribed by Ekman, J.; Antonini, G.; Orlandi, A.; Ruehli, A.E.

Book ID: 126468088
Publisher: IEEE
Year: 2004
Weight: 440 KB
Volume: 1
Category: Article
ISBN-13: 9780780384439
DOI: 10.1109/ISEMC.2004.1350039

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2004 International Symposium on El

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Investigation of cavity resonances in an automobile

✍ Haixiao Weng, ; Beetmer, D.G.; Hubing, T.H.; Xiaopeng Dong, ; Wiese, R.; McCallu 📂 Article 📅 2004 🏛 IEEE ⚖ 337 KB

[IEEE 2004 International Symposium on El

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Near-field techniques for detecting EMI sources

✍ Baudry, D.; Bicrel, F.; Bouchelouk, L.; Louis, A.; Mazari, B.; Eudeline, P. 📂 Article 📅 2004 🏛 IEEE ⚖ 386 KB

[IEEE 2004 International Symposium on El

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Using near-field scanning to predict radiated fields

✍ Shi, J.; Cracraft, M.A.; Zhang, J.; DuBroff, R.E.; Slattery, K. 📂 Article 📅 2004 🏛 IEEE ⚖ 790 KB

[IEEE 2004 International Symposium on El

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Anticipating EMI and on-board interference in automotive platforms

✍ Sun, S.; Liu, G.; Pommerenke, D.J.; Drewniak, J.L.; Kautz, R.W.; Chen, C. 📂 Article 📅 2004 🏛 IEEE ⚖ 471 KB

[IEEE 2004 International Symposium on El

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Comparison of via equivalent circuit model accuracy using quasi-static and full-wave approaches

✍ Archambeault, B.; Connor, S.; Jianmin Zhang, ; Drewniak, J.; Lai, M.; Orlandi, A 📂 Article 📅 2004 🏛 IEEE ⚖ 295 KB

[IEEE 2004 International Symposium on El

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - FDTD comparison of SAR and temperature rise in human tissue

✍ Luebbers, R.; Penney, C.W. 📂 Article 📅 2004 🏛 IEEE ⚖ 308 KB