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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Near-field techniques for detecting EMI sources

✍ Scribed by Baudry, D.; Bicrel, F.; Bouchelouk, L.; Louis, A.; Mazari, B.; Eudeline, P.

Book ID: 126994107
Publisher: IEEE
Year: 2004
Weight: 386 KB
Volume: 1
Category: Article
ISBN-13: 9780780384439
DOI: 10.1109/isemc.2004.1349987

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