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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Using near-field scanning to predict radiated fields

✍ Scribed by Shi, J.; Cracraft, M.A.; Zhang, J.; DuBroff, R.E.; Slattery, K.

Book ID: 121833838
Publisher: IEEE
Year: 2004
Weight: 790 KB
Volume: 1
Category: Article
ISBN-13: 9780780384439
DOI: 10.1109/ISEMC.2004.1349988

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