[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Comparison of via equivalent circuit model accuracy using quasi-static and full-wave approaches

✍ Scribed by Archambeault, B.; Connor, S.; Jianmin Zhang, ; Drewniak, J.; Lai, M.; Orlandi, A.; Antonini, G.; Ruehli, A.

• Book ID: 118023232
• Publisher: IEEE
• Year: 2004
• Weight: 295 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780384439
• DOI: 10.1109/isemc.2004.1349962