[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Time domain analysis of lossy shielded cables by CAD circuit simulators

✍ Scribed by Caniggia, S.; Feliziani, M.; Manzi, G.; Maradei, F.

• Book ID: 118051295
• Publisher: IEEE
• Year: 2004
• Weight: 357 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780384439
• DOI: 10.1109/isemc.2004.1349954